EMC News archive 2006

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News archive 2006

News archive 2005

News archive 2004

28 February 2006

Goodbye and Good Luck

After Philips had decided to combine its EMC expertise in one organization, I was asked to manage this change and to develop plans to realize a new EMC lab on the High Tech Campus in Eindhoven. In early 2003 representatives of various EMC expert groups in Philips were involved in creating plans for a coherent and future proof approach to maintain and expand relevant EMC competencies for both Philips and external customers.

 

An ambitious business plan was presented to Philips senior R&D management and they approved the execution of this plan.

 

For me this was the start of a very exciting period where we were able to establish a brand new EMC facility on the High Tech Campus in Eindhoven, The Netherlands. The official opening of the state-of-the art EMC lab in September 2004 can be considered as a major milestone on the road towards the creation of an economy of scale for EMC, ESD and EMF expertise.

 

Today the EMC center is able to support its customers from early architectural design choices to full (accredited) compliance testing for a wide range of consumer, professional and industrial standards. We have experts in ICs, PCBs and total products and solutions supporting an integral design approach not only for EMC, ESD, EMF or wireless coexistence but also to provide Signal Integrity (SI) and Power Integrity (PI) solutions that really make a difference in product performance. We set out to become a profitable service provider for our customers in many areas of design support to enable right first time design of electronic products and solutions.

 

Today EMC is part of a wider service offering within Philips Applied Technologies and has numerous loyal customers that increasingly call upon us to support their business. The upcoming challenge is to further exploit the competencies in new markets and external Philips. I am very glad that Frits Gehring succeeds me with a clear ambition to make this happen.

 

As (probably) a last step in my career, I am taking up a challenge outside Philips but I am convinced that EMC has a ‘radiating’ future.

I would like to take the opportunity to thank all our customers for their support and pleasant relations we developed over the years. I also want to thank the management of Philips Applied Technologies and Corporate Technologies for their continuous interest and support and last but not least I want to thank all the present and past employees of EMC for the great years.

 

EMC and Frits goodbye and good luck!

Piet Berkhout

 

 

3 October 2006

Open Innovation and New Products

High Tech Campus Eindhoven

 

We will participate in the event: "Open Innovation & New Products" in October 2006 on the High Tech Campus Eindhoven.

 

Piet Berkhout will present at 15:15 hours Expert support: Cost or value creation

Expert support is used in every organization. Accountants, lawyers, engineers or Ad agencies, to name a few, are involved in the day-to-day operation of almost every organization. In many cases they are an intrinsic part of our operations and processes. We are not able to deliver our products and services without their support.

But do we know how we have arranged for their support? If they are part of our payroll we might have their commitment and continuous involvement. When we hire these experts, or have outsourced specific services and tasks to third parties, how do we then manage their availability?

In many cases expert support and services are hired and managed via purchasing with a strong focus on cost. By doing this we might loose numerous opportunities for exploitation of expert support to create value and quite often IPR (Intellectual Property Rights) for our business. The Open Innovation structure of the High Tech Campus Eindhoven offers numerous opportunities for technology based businesses to create additional value by involving relevant partners.

The presentation will provide a number of compelling examples of value creation by expert ideas. On the other hand lack of the timely involvement of specific expertise can lead to disastrous situations.

A summary of do's and don'ts will be discussed.

 

We are also present with a stand and visitors to the event have the opportunity to visit our unique facilities.

 

For more information: http://www.contactnl.com/?page=34&evenement_id=5

 

 

18 September 2006

Philips Applied Technologies' Mart Coenen has received IEC 1906 Award

 

On September 18th 2006, the International Electrotechnical Commission (IEC) has granted the prestigious IEC 1906 Award to Mart Coenen of Philips Applied Technologies. Mart Coenen received the award as recognition for his contributions in the field of Electromagnetic Compatibility (EMC) standardization within the IEC subcommittees for IC standardization.

 

The International Electrotechnical Commission (IEC) was established in 1906. Working group IEC TC47A/WG9 was established in 1996 and deals with all EMC measurement techniques that are used at the IC level. The participants are representatives from most of the European, American and Japanese automotive IC suppliers, their customers and several Technical Universities.

 

Since 2000 Mart Coenen has been convening this working group.

 

 

March 2006

New reference book on EMC for ICs

The ElectroMagnetics Competence center, represented by Mart Coenen has been a co-author for the following state of the art handbook on Electromagnetic Compatibility of ICs. Most of the public information has been combined in this book in close collaboration with EMC people from ST, Infineon, Freescale and various universities:

 

Electromagnetic Compatibility of Integrated Circuits

Techniques for low emission and susceptibility

Ben Dhia, Sonia; Ramdani, Mohamed; Sicard, Etienne (Eds.)

2006, XIV, 474 p. 464 illus., Hardcover

ISBN: 0-387-26600-3

 

About this book

Electromagnetic Compatibility of Integrated Circuits: Techniques for Low Emission and Susceptibility focuses on the electromagnetic compatibility of integrated circuits. The basic concepts, theory, and an extensive historical review of integrated circuit emission and susceptibility are provided. Standardized measurement methods are detailed through various case studies. EMC models for the core, I/Os, supply network, and packaging are described with applications to conducted switching noise, signal integrity, near-field and radiated noise. Case studies from different companies and research laboratories are presented with in-depth descriptions of the ICs, test set-ups, and comparisons between measurements and simulations. Specific guidelines for achieving low emission and susceptibility derived from the experience of EMC experts are presented. The companion CD-ROM includes software illustrating key aspects of the book and a collection of demo tools applicable to EMC analysis of ICs.

 

Book Chapters to which we have contributed:

4) Measurement methods - Labussière, Drissi, Lochot, Carlton, Coenen, Demoulin, Ben Dhia, Marot

6) Case study - Vrignon, Steinecke, Bouhouch, Perdriau, Coenen, Baffreau, Lamoureux, hikawa

7) Guidelines & design rules - Coenen, Sicard, Baffreau, Fiori

 

 

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